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Applied Scanning Probe Methods VI: Characterization (NanoScience and Technology)

Bharat Bhushan
4.9/5 (33095 ratings)
Description:This volume will examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for practically one volume every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. The chapters will be written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.We have made it easy for you to find a PDF Ebooks without any digging. And by having access to our ebooks online or by storing it on your computer, you have convenient answers with Applied Scanning Probe Methods VI: Characterization (NanoScience and Technology). To get started finding Applied Scanning Probe Methods VI: Characterization (NanoScience and Technology), you are right to find our website which has a comprehensive collection of manuals listed.
Our library is the biggest of these that have literally hundreds of thousands of different products represented.
Pages
383
Format
PDF, EPUB & Kindle Edition
Publisher
Springer
Release
2006
ISBN
3540373195

Applied Scanning Probe Methods VI: Characterization (NanoScience and Technology)

Bharat Bhushan
4.4/5 (1290744 ratings)
Description: This volume will examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for practically one volume every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. The chapters will be written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.We have made it easy for you to find a PDF Ebooks without any digging. And by having access to our ebooks online or by storing it on your computer, you have convenient answers with Applied Scanning Probe Methods VI: Characterization (NanoScience and Technology). To get started finding Applied Scanning Probe Methods VI: Characterization (NanoScience and Technology), you are right to find our website which has a comprehensive collection of manuals listed.
Our library is the biggest of these that have literally hundreds of thousands of different products represented.
Pages
383
Format
PDF, EPUB & Kindle Edition
Publisher
Springer
Release
2006
ISBN
3540373195

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